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A Process Variation Tolerant Embedded Split-Gate Flash Memory Using Pre-Stable Current Sensing Scheme.

Meng-Fan ChangShin-Jang Shen
Published in: IEEE J. Solid State Circuits (2009)
Keyphrases
  • embedded systems
  • flash memory
  • garbage collection
  • case study
  • database systems
  • feature selection
  • data analysis
  • open source
  • file system
  • solid state