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Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling.
Eishi Ibe
S. S. Chung
ShiJie Wen
Hironaru Yamaguchi
Yasuo Yahagi
Hideaki Kameyama
Shigehisa Yamamoto
Takashi Akioka
Published in:
CICC (2006)
Keyphrases
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data mining
neural network
three dimensional
databases
machine learning
data acquisition
microscopic images
real world
decision trees
image segmentation
similarity measure
bayesian networks
input device
scaling factors
electronic devices