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Active Cantilevers with Diamond-Tip for Field Emission Scanning Probe Lithography and Imaging.
Martin Hofmann
Stephan Mechold
Mathias Holz
Ahmad Ahmad
Tzvetan Ivanov
Ivo W. Rangelow
Published in:
ICM (2019)
Keyphrases
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image processing
imaging technology
scan data
image analysis
high resolution
low cost
artificial intelligence
imaging systems
synthetic aperture
single shot