On Peculiarities of S-Parameter Measurements.

Yves Rolain Wendy Van Moer Jeffrey A. Jargon Donald C. DeGroot

Published in: IEEE Trans. Instrum. Meas. (2007)

Keyphrases

parameter values
wide range
input parameters
database
computer vision
probabilistic model
parameter space
measurement error
sensor measurements
genetic algorithm
special case
particle swarm optimization
measured data