A 1V 11b 200MS/s Pipelined ADC with Digital Background Calibration in 65nm CMOS.
Kang-Wei HsuehYu-Kai ChouYu-Hsuan TuYi-Fu ChenYa-Lun YangHung-Sung LiPublished in: ISSCC (2008)
Keyphrases
- analog to digital converter
- metal oxide semiconductor
- circuit design
- low cost
- cmos image sensor
- high speed
- cmos technology
- low power
- camera calibration
- power consumption
- mixed signal
- single chip
- nm technology
- data flow
- silicon on insulator
- image sequences
- power supply
- integrated circuit
- digital content
- bounding box
- delay insensitive
- sigma delta
- wide dynamic range
- camera parameters
- digital camera