An accurate closed-expression model for FinFETs parasitic resistance.

A. S. N. Pereira Renato C. Giacomini

Published in: Microelectron. Reliab. (2015)

Keyphrases

computational model
mathematical model
bayesian framework
high quality
closed form
d objects
high accuracy
parameter estimation
maximum likelihood
conceptual model
theoretical framework
theoretical analysis
database
probabilistic model
objective function
information systems
computer vision