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Technical artifacts: An integrated perspective.
Stefano Borgo
Maarten Franssen
Pawel Garbacz
Yoshinobu Kitamura
Riichiro Mizoguchi
Pieter E. Vermaas
Published in:
Appl. Ontology (2014)
Keyphrases
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high quality
wide variety
neural network
viewpoint
data mining
information systems
feature selection
relational databases
multiresolution