Characterization of fading of a MOS-based sensor for occupational radiation dosimetry.
Charilaos MousoulisChristian I. ElmigerManik SinghalYi XuanTimothy McNameeJames ThistlethwaitePaul Alexander WalerowMark SalaskySean ScottDaniel J. ValentinoDimitrios PeroulisPublished in: IEEE SENSORS (2016)