Using Dielectrophoretic Impedance Measurement Method.
Takaharu EnjojiSatoshi UchidaFumiyoshi TochikuboPublished in: Intell. Autom. Soft Comput. (2012)
Keyphrases
- classification method
- significant improvement
- objective function
- high precision
- experimental evaluation
- clustering method
- cost function
- support vector machine svm
- detection method
- support vector machine
- synthetic data
- theoretical analysis
- data sets
- classification accuracy
- error rate
- feature set
- segmentation method
- fully automatic
- optimization algorithm
- main contribution
- high accuracy
- probabilistic model
- dynamic programming
- prior knowledge
- preprocessing
- computer vision