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An Asymmetric Distance Model for Cross-View Feature Mapping in Person Reidentification.
Ying-Cong Chen
Wei-Shi Zheng
Jian-Huang Lai
Pong C. Yuen
Published in:
IEEE Trans. Circuits Syst. Video Technol. (2017)
Keyphrases
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feature mapping
pattern recognition
machine learning
image processing
multi class
distance measure
distance function