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Analysis of a new intra-disk redundancy scheme for high-reliability RAID storage systems in the presence of unrecoverable errors.

Ajay DholakiaEvangelos EleftheriouXiao-Yu HuIlias IliadisJai MenonK. K. Rao
Published in: SIGMETRICS/Performance (2006)
Keyphrases
  • storage systems
  • high reliability
  • file system
  • disk drives
  • data mining
  • flash memory
  • general purpose
  • embedded systems