Login / Signup

Scan-path based testing of systems on a chip.

Samiha MouradBruce S. Greene
Published in: ICECS (1999)
Keyphrases
  • computer systems
  • management system
  • case study
  • high speed
  • learning systems
  • scan data
  • database
  • data sets
  • information systems
  • e learning
  • distributed systems
  • complex systems
  • computing systems