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Performance improvement of SOI Tunnel-FET using pure boron and Ge pocket layer.

Karabi BaruahSatyabrat Malla Bujar BaruahSrimanta Baishya
Published in: Microelectron. J. (2024)
Keyphrases
  • application layer
  • multi layer
  • significant improvement
  • real world
  • information systems
  • expert systems
  • low cost
  • simulation model