Login / Signup

Cost models for overlapping and multiversion structures.

Yufei TaoDimitris PapadiasJun Zhang
Published in: ACM Trans. Database Syst. (2002)
Keyphrases
  • statistical models
  • neural network
  • machine learning
  • three dimensional
  • mobile devices
  • parameter estimation
  • total cost
  • high cost
  • expected cost