A New Dual-Channel Measurement Method for Accurate Characterization of Low-Permittivity and Low-Loss Materials.
Hao XuWeijun LiangQiulai GaoPublished in: IEEE Trans. Instrum. Meas. (2018)
Keyphrases
- high accuracy
- pairwise
- computational cost
- cost function
- highly accurate
- experimental evaluation
- high precision
- computational complexity
- similarity measure
- computationally efficient
- clustering method
- synthetic data
- feature extraction
- image processing
- prior knowledge
- objective function
- neural network
- high quality
- support vector machine
- detection method