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Total ionizing radiation effects of 2-T SONOS for 130 nm/4 Mb NOR flash memory technology.

Fengying QiaoLiyang PanXiao YuHaozhi MaDong WuJun Xu
Published in: Sci. China Inf. Sci. (2014)
Keyphrases
  • flash memory
  • ionizing radiation
  • storage devices
  • file system
  • garbage collection
  • hard disk
  • random access
  • solid state
  • disk drives
  • database systems
  • personal computer
  • databases
  • small size
  • storage systems