Reliability of Industrial grade Embedded-STT-MRAM.

Yongsung Ji Hyunjae Goo Jungman Lim Tae-Young Jeong Taiki Uemura Gun Rae Kim Boil Seo Seungbae Lee Goeun Park Jeongmin Jo Sang Il Han Kilho Lee Junghyuk Lee Sohee Hwang Daesop Lee Suksoo Pyo Hyun Taek Jung Shinhee Han Seungmo Noh Kiseok Suh Sungyoung Yoon Hyeonwoo Nam Hyewon Hwang Hai Jiang J. W. Kim D. Kwon Yoonjong Song K. H. Koh Hwasung Rhee Sangwoo Pae E. Lee

Published in: IRPS (2020)

Keyphrases

design considerations
industrial applications
control software
embedded systems
highly reliable
technology transfer
computer vision
database systems
learning environment
artificial neural networks
watermarking algorithm
software reliability
location prediction
random access memory