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Simulation of failure time distributions of metal lines under electromigration.
M. R. Carriero
Stefano Di Pascoli
Giuseppe Iannaccone
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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probability distribution
random variables
mathematical model
line drawings
data sets
neural network
real time
data mining
genetic algorithm
hough transform
line segments
simulation study
mathematical models
simulation models