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Microprocessor reliability-performance tradeoffs assessment at the microarchitecture level.
Sotiris Tselonis
Manolis Kaliorakis
Nikos Foutris
George Papadimitriou
Dimitris Gizopoulos
Published in:
VTS (2016)
Keyphrases
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circuit design
early stage
neural network
higher level
multiscale
database
information retrieval
computer vision
decision trees
operating system
quality assessment
levels of abstraction
assessment process
confidence levels