Characterization of border traps in III-V MOSFETs using an RF transconductance method.
Sofia JohanssonJiongjiong MoErik LindPublished in: ESSDERC (2013)
Keyphrases
- experimental evaluation
- fully automatic
- detection method
- significant improvement
- cost function
- dynamic programming
- neural network
- data sets
- preprocessing
- computational cost
- clustering method
- theoretical analysis
- power consumption
- high precision
- segmentation algorithm
- support vector machine svm
- high accuracy
- classification accuracy
- probabilistic model
- computational complexity
- objective function