Reliability aspects of 3D-oriented heterogeneous device design related to stress sensitivity of MOS transistors.
Grzegorz JanczykTomasz BieniekJerzy SzynkaPiotr GrabiecPublished in: 3DIC (2009)
Keyphrases
- data mining
- databases
- design choices
- design space
- engineering design
- computer aided
- closely related
- real world
- knowledge base
- user interface
- design process
- search engine
- data acquisition
- software architecture
- genetic algorithm
- conceptual model
- sensitivity analysis
- information retrieval
- design decisions
- design issues
- optimal design
- database