Automatic Reclaimed Wafer Classification Using Deep Learning Neural Networks.
Po-Chou ShihChun-Chin HsuFang-Chih TienPublished in: Symmetry (2020)
Keyphrases
- deep learning
- neural network
- pattern recognition
- machine learning
- unsupervised learning
- decision trees
- restricted boltzmann machine
- text classification
- feature extraction
- support vector
- support vector machine
- unsupervised feature learning
- decision making
- feature vectors
- feature space
- semi supervised
- image classification
- multiscale
- model selection
- named entities
- feature selection
- information retrieval
- data sets