A first-order charge conserving MOS capacitance model.
Karem A. SakallahYao-Tsung YenSteve S. GreenbergPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
- probabilistic model
- network model
- management system
- hierarchical structure
- experimental data
- higher order
- high speed
- theoretical framework
- input data
- sensitivity analysis
- conceptual model
- statistical model
- mathematical model
- theoretical analysis
- genetic algorithm
- cost function
- evolutionary algorithm
- objective function
- similarity measure
- high level