Reordering Algorithm for Minimizing Test Power in VLSI Circuits.
K. ParamasivamK. GunavathiPublished in: Eng. Lett. (2007)
Keyphrases
- learning algorithm
- detection algorithm
- dynamic programming
- k means
- vlsi circuits
- simulated annealing
- preprocessing
- objective function
- computational complexity
- high resolution
- np hard
- optimal solution
- evolutionary algorithm
- pattern recognition
- video sequences
- digital images
- signal processing
- particle swarm optimization
- segmentation algorithm
- image processing algorithms
- real time