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Modeling and Validation of Fixture-Induced Error for Impedance Measurements.

Blake W. NelsonAndrew N. LemmonBrian T. DeBoiTodd J. Freeborn
Published in: IEEE Trans. Instrum. Meas. (2019)
Keyphrases
  • model validation
  • measurement noise
  • measurement error
  • genetic algorithm
  • computer vision
  • modeling framework
  • information systems
  • multiscale
  • lower bound
  • evolutionary algorithm
  • control system
  • error rate
  • error analysis