Pseudo-Ring Testing Schemes and Algorithms of RAM Built-In and Embedded Self-Testing
Diana BodeanGhenadie BodeanWajeb GharibiPublished in: CoRR (2011)
Keyphrases
- orders of magnitude
- data structure
- benchmark datasets
- computational cost
- optimization problems
- computationally efficient
- theoretical analysis
- learning algorithm
- computational efficiency
- computationally expensive
- software testing
- evolutionary algorithm
- denoising
- worst case
- computational complexity
- classification algorithm
- times faster
- black box
- graph theory
- stopping criteria