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Statistical Gate-Delay Modeling with Intra-Gate Variability.
Kenichi Okada
Kento Yamaoka
Hidetoshi Onodera
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2003)
Keyphrases
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statistical modeling
multiple input
statistical information
nano scale
statistical models
database
real time
software engineering
statistical analysis
information theoretic
statistical methods
modeling language
cmos technology
critical path