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Design of a high-voltage rail-to-rail error amplifier based on standard CMOS used in an LDO.

Sara PashminehStefan BramburgerDirk Killat
Published in: CCECE (2016)
Keyphrases
  • high speed
  • high voltage
  • circuit design
  • design process
  • neural network
  • evolutionary algorithm
  • single chip
  • real time
  • error rate
  • test set
  • power consumption