A Wafer Bin Map "Relaxed" Clustering Algorithm for Improving Semiconductor Production Yield.

Crescenzio Gallo Vito Capozzi

Published in: Open Comput. Sci. (2020)

Keyphrases

semiconductor manufacturing
clustering algorithm
process control
production system
maximum a posteriori
data clustering
fuzzy c means
clustering analysis
real time
search engine
k means
text mining
clustering method
cluster analysis