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Edit and Alphabet-Ordering Sensitivity of Lex-Parse.

Yuto NakashimaDominik KöpplMitsuru FunakoshiShunsuke InenagaHideo Bannai
Published in: MFCS (2024)
Keyphrases
  • pattern matching
  • high sensitivity
  • sensitivity analysis
  • partial order
  • image processing
  • finite automata
  • knowledge base
  • information extraction
  • parse tree
  • shows a significant improvement
  • alphabet size