Researcher Bias: The Use of Machine Learning in Software Defect Prediction.
Martin J. ShepperdDavid BowesTracy HallPublished in: IEEE Trans. Software Eng. (2014)
Keyphrases
- software defect prediction
- machine learning
- sample selection bias
- feature ranking
- ensemble learning
- inductive bias
- class imbalance
- pattern recognition
- reinforcement learning
- data mining
- feature selection
- neural network
- machine learning algorithms
- learning tasks
- active learning
- text classification
- machine learning methods
- supervised learning
- text mining
- semi supervised learning
- high dimensional data
- test set
- kernel methods
- inductive learning
- support vector machine
- data points