An Automatic Self-Checking and Fault-Locating Method.
Fred LeePublished in: IRE Trans. Electron. Comput. (1962)
Keyphrases
- fully automatic
- mathematical model
- synthetic data
- high precision
- cost function
- computational cost
- data sets
- objective function
- classification method
- pairwise
- experimental study
- optimization method
- matching algorithm
- computationally efficient
- support vector machine
- experimental evaluation
- dynamic programming
- feature space
- computational complexity
- feature selection
- computer vision
- neural network