Modelling uncertainty in ESATS by classification inference: An expert system for the analysis of thallium-201 scintigrams.
Eric BackerJan J. GerbrandsJohan H. C. ReiberA. E. M. ReijsW. KrijgsmanH. Jaap van den HerikPublished in: Pattern Recognit. Lett. (1988)
Keyphrases
- image classification
- pattern recognition
- automatic segmentation
- decision trees
- bayesian networks
- support vector machine
- feature selection
- support vector machine svm
- benchmark datasets
- classification method
- higher order
- classification systems
- pattern analysis
- machine learning methods
- classification algorithm
- machine learning
- feature space
- support vector
- learning algorithm