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High-Order Syndrome Testing for VLSI Circuits.

Shiyi Xu
Published in: PRDC (2005)
Keyphrases
  • high order
  • vlsi circuits
  • higher order
  • low order
  • pairwise
  • low power
  • lower order
  • bayesian logistic regression
  • fourth order
  • tensor analysis
  • mixed signal
  • markov random field
  • real time
  • single image