A Two-Stage Deep Learning-Based Approach for Automatic Reading of Analog Meters.

Shohei Ueda Kaito Suzuki Jumpei Kanno Qiangfu Zhao

Published in: SCIS/ISIS (2020)

Keyphrases

deep learning
unsupervised learning
machine learning
unsupervised feature learning
mental models
weakly supervised
computer vision
face recognition
decision makers
pattern recognition
high dimensional
viewpoint
information extraction
object detection
object class
deep architectures