Test pattern generation for timing-induced functional errors in hardware-software systems.
Srikanth ArekapudiFei XinJinzheng PengIan G. HarrisPublished in: HLDVT (2001)
Keyphrases
- software systems
- embedded systems
- software engineering
- source code
- software development
- software design
- software architecture
- software components
- functional requirements
- software quality
- software maintenance
- software developers
- metamodel
- design patterns
- software engineers
- software projects
- linux kernel
- complex software systems
- clone detection
- machine learning
- software artifacts
- software testing
- open source
- high level