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Assisted Diagnostics Methodology for Complex High-Tech Applications.

Marina VelikovaCarmen BratosinAlexander YpmaVera LemmenRobert Jan van Wijk
Published in: ICSRS (2019)
Keyphrases
  • high tech
  • databases
  • real world
  • high level
  • complex systems
  • database
  • information systems
  • bayesian networks
  • wide range
  • information technology
  • higher level
  • computationally intensive
  • complex environments
  • world wide