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Development of pathological brain detection system using Jaya optimized improved extreme learning machine and orthogonal ripplet-II transform.

Deepak Ranjan NayakRatnakar DashBanshidhar Majhi
Published in: Multim. Tools Appl. (2018)
Keyphrases
  • extreme learning machine
  • support vector regression
  • feed forward neural networks
  • expert systems
  • feedforward neural networks