An Improved Rule-Based Dummy metal Fill Method for 65 nm ASIC Design.
Xiaoming ChenLing XinJianwei ZhangSongsong LiPublished in: J. Circuits Syst. Comput. (2013)
Keyphrases
- computational cost
- high accuracy
- experimental evaluation
- significant improvement
- detection method
- computational complexity
- preprocessing
- cost function
- classification method
- objective function
- feature set
- design methodology
- data sets
- high precision
- model selection
- low cost
- classification accuracy
- prior knowledge
- user interface
- expert systems
- similarity measure
- feature selection
- genetic algorithm
- neural network