A Thermal Failure Model for MOSFETs Under Repetitive Electromagnetic Pulses.
Yong LiHaiyan XieHui YanJianguo WangZhiqiang YangPublished in: IEEE Access (2020)
Keyphrases
- probabilistic model
- computational model
- information retrieval
- case study
- statistical model
- theoretical analysis
- database
- decision making
- mathematical model
- repetitive patterns
- network model
- formal model
- model selection
- data model
- evolutionary algorithm
- similarity measure
- knowledge base
- information systems
- social networks