A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS.
Fei LuRui MaZongyu DongLi WangChen ZhangChenkun WangQi ChenX. Shawn WangFeilong ZhangCheng LiHe TangYuhua ChengAlbert Z. WangPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2016)