Robust Positioning Patterns with Low Redundancy.

Yeow Meng Chee Duc Tu Dao Han Mao Kiah San Ling Hengjia Wei

Published in: SIAM J. Comput. (2020)

Keyphrases

pattern mining
parameter tuning
high levels
information retrieval
knowledge base
website
image segmentation
data structure
digital images
data mining techniques
frequent patterns
pattern discovery
image noise