Near-field optical scanning microscopy with tunnel-distance regulation.

Urs Dürig Dieter Pohl Flavio Rohner

Published in: IBM J. Res. Dev. (1986)

Keyphrases

image analysis
distance measure
scan data
optical fiber
high throughput
euclidean distance
distance measurement
average distance
image capture
long range
information management
real time
distance function
low cost
pattern recognition
case study
computer vision
data sets