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Subthreshold 1-Bit Full Adder Cells in sub-100 nm Technologies.

Vahid MoalemiAli Afzali-Kusha
Published in: ISVLSI (2007)
Keyphrases
  • bit parallel
  • data mining
  • real time
  • data sets
  • learning environment
  • low cost
  • learning systems
  • pattern matching
  • future development
  • emerging technologies