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FIGHT-Metric: Functional Identification of Gate-Level Hardware Trustworthiness.

Dean SullivanJeff BiggersGuidong ZhuShaojie ZhangYier Jin
Published in: DAC (2014)
Keyphrases
  • real time
  • low cost
  • similarity metric
  • hardware and software
  • image processing
  • high speed
  • levels of abstraction
  • automatic identification
  • mass spectrometry
  • nano scale