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Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy.
A. C. Lamb
J. F. W. Schiz
J. M. Bonar
F. Cristiano
Peter Ashburn
S. Hall
P. L. F. Hemment
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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thin film
dual channel