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Reliability of power transistors against application driven temperature swings.
Sudha Gopalan
Benno H. Krabbenborg
Jan-Hein Egbers
Bart van Velzen
Rene Zingg
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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power consumption
neural network
decision trees
information systems
expert systems
model driven
heat transfer