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Reliability of power transistors against application driven temperature swings.

Sudha GopalanBenno H. KrabbenborgJan-Hein EgbersBart van VelzenRene Zingg
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • power consumption
  • neural network
  • decision trees
  • information systems
  • expert systems
  • model driven
  • heat transfer