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Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.
Jizuo Zhang
Jianjun Chen
Pengcheng Huang
Shouping Li
Liang Fang
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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cmos technology
low power
spl times
power consumption
computer systems
parallel processing
image processing
pattern recognition
mathematical morphology