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Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.

Jizuo ZhangJianjun ChenPengcheng HuangShouping LiLiang Fang
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • cmos technology
  • low power
  • spl times
  • power consumption
  • computer systems
  • parallel processing
  • image processing
  • pattern recognition
  • mathematical morphology