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Single- and Multi-Frequency Direct Sampling Methods in a Limited-Aperture Inverse Scattering Problem.

Sangwoo KangMarc LambertChi Young AhnTaeyoung HaWon-Kwang Park
Published in: IEEE Access (2020)
Keyphrases
  • sampling methods
  • random sampling
  • training data
  • high resolution
  • markov random field
  • class imbalance