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Robust Gaussian process regression with a bias model.

Chiwoo ParkDavid J. BorthNicholas S. WilsonChad N. HunterFritz J. Friedersdorf
Published in: Pattern Recognit. (2022)
Keyphrases
  • gaussian process regression
  • probabilistic model
  • similarity measure
  • feature space
  • em algorithm
  • pose normalization